Monday, July 4, 2011

We Are Going To Berlin

We got some great news to share! Apparently the ETSI board liked our abstract on Model-Based Integration Testing so much they decided to grant us a 20 minute presentation slot at the 2011 Model-Based Testing User Conference in Berlin on October 18-20th (which I previously announced on the blog).

Seeing how this idea on Model-Based Integration Testing has been blue-stamped by an authority, I thought it would be a good idea to share some of the details of our framework over a series of upcoming blog posts. The plan is to reveal some more details here that can be presented in 20 minutes. Then I will be able to refer participants to this blog for more details.

The basic idea of the framework is to generate model based tests that span multiple feature boundaries within the SUT. We obtain this behavior using a producer/consumer pattern on “Universally Recognized Artifacts” (URAs) which are cleverly chosen pieces of information inside the SUT that “resides on the boundaries of system features”.

For now, we are very excited about this, and looking forward to a great conference!

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